KAD/ADC/109/S2 Full-bridge ADC (voltage excitation, programmable analog gain, sense lines, 6 kHz b/w) – 8 channels at 24 ksps
The KAD/ADC/109/S2 has eight channels of signal conditioning and data acquisition for differential voltages, strain gage or bridge measurements. In addition to the measurement channel, the KAD/ADC/109/S2 provides independent bipolar excitation for up to eight channels.
Each differential ended signal has a separate programmable amplifier, filter and A/D converter. At the heart of the KAD/ADC/109/S2 is a hard-wired state-machine that over-samples all channels at a rate between 96 ksps and 192 ksps and digitally filters any noise above the user-programmable cutoff frequency. This is achieved using cascaded, half-band, decimate by two, 15 tap, Finite-Impulse-Response (FIR) filters with 32-bit coefficients followed by an 8thth order Butterworth Infinite-Impulse-Response (IIR) filter with a default cutoff point set at a quarter of the sampling frequency.
All signals are sampled simultaneously. Thus, when several channels are sampled at different sampling rates, all channels are aligned at the start of an acquisition cycle.
The KAD/ADC/109/S2 is intended for use with strain gages, and should not be used for asymmetric bridge transducers such as accelerometers, pressure transducers unless sensor re-calibration is carried out on a channel-by-channel basis. If the sense lines or internal offset adjust (balance feature) are not required, refer to the KAD/ADC/109/S1.
- REQUEST A QUOTE
- Eight full or ½-bridge, potentiometer or differential ended channels
- 16-bit simultaneous sampling on all channels
- High accuracy
- Programmable excitation, balance current and range per channel
- 8th order Butterworth filter with programmable cutoff frequency per channel
- Short to ground on any channel does not affect others
- Separate pair of sense lines for each channel
- Bipolar excitation and balancing before instrumentation amplifier
- Up to 24,000 samples per second per channel
- Up to 6 kHz bandwidth
- Enhanced mechanical strength between motherboard and daughterboard
- Bridge sensors
- Differential voltage measurement
- Strain gage measurement
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