Flash Memory Lifespan and Reliability
Flash memory devices are used everywhere in today’s contemporary electronics as low-cost, non-volatile data storage components. In contrast with one-time-programmable (OTP) or UV-erasable memory devices, flash devices can be erased and reprogrammed in-circuit, making them ideal for applications where occasional updates or even high-speed frequent updates are needed.
However, various factors impact the lifespan of a flash memory device, particularly in the challenging environments faced by commercial and military technology. Our white paper explores types of flash memory devices, including NOR flash memory and NAND flash memory, before exploring how factors such as reads, extended temperatures, and Program/Erase (P/E) cycles impact their long-term reliability. It also examines a variety of considerations and techniques for extending the endurance of flash memory devices.