Flight test instrumentation (FTI) systems are becoming more complex, with the need to capture high-frequency phenomena, leading to new design, integration, installation, and troubleshooting challenges. The greater complexity of FTI systems is primarily due to the increasing demand for more data, which results in higher numbers of sensors, higher data rates, and additional data acquisition from a wider range of systems.
To address these evolving requirements, FTI system designers must consider using more data acquisition units (DAUs), Ethernet switches, higher speed and capacity recorders, and possibly, more complex telemetry systems.
This white paper examines the different approaches to building a comprehensive FTI system, the advantages and disadvantages of mixing different vendors’ products, and the likely impact of future developments.
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Sridhar Kanamaluru
Sridhar Kanamaluru is a Chief Architect and manager of product management within the Aerospace Instrumentation group of Curtiss-Wright. He received his Ph.D. in Electrical Engineering from Texas A&M University in 1996. He has over 30 years of experience in research, product development, and engineering management for microwave, radar, and flight test instrumentation products. He joined Curtiss-Wright, Newtown, in 2013 as Director of Radar and Antenna Systems. He is also a Curtiss-Wright technical fellow.
